The University of Dodoma Library Catalog

Normal view MARC view

Delay faults (Semiconductors) (Topical Term)

Preferred form: Delay faults (Semiconductors)

Machine generated authority record.

Work cat.: (OSt)0: Sivaraman, Mukund, 1970- 1144, A unified approach for timing verification and delay fault testing /, c1998.

© The University of Dodoma 2020