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Failure analysis of integrated circuits : tools and techniques / edited by Lawrence C. Wagner.

Contributor(s): Wagner, Lawrence C.
Material type: TextTextPublisher: Boston, Mass. : Kluwer Academic Publishers, c1999Description: ix, 255 p. : ill. ; 25 cm.ISBN: 0412145618 (acidfree paper).Subject(s): Semiconductors -- Failures | Integrated circuits -- Testing | Integrated circuits -- ReliabilityDDC classification: 621.3815 Online resources: Publisher description | Table of contents only
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Item type Current location Call number Status Date due Barcode
Books Books Library, College of Informatics and Virtual Education (CIVE)
General Collection
TK7871.852 .F35 1999 (Browse shelf) Available 8031

"SECS 494"--P. [4] of cover.

Includes bibliographical references and index.

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