Defect and fault tolerance in VLSI systems. (Record no. 4399)

MARC details
000 -LEADER
fixed length control field 01441cas a2200361 a 4500
001 - CONTROL NUMBER
control field 11391432
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20150608142706.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field t|
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 910327d19891990nyuar 1 a0eng
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER
LC control number 91656086
022 0# - INTERNATIONAL STANDARD SERIAL NUMBER
International Standard Serial Number 1055-9329
Source 1
035 ## - SYSTEM CONTROL NUMBER
System control number (OCoLC)ocm23313596
040 ## - CATALOGING SOURCE
Original cataloging agency DLC
Transcribing agency DLC
Modifying agency NSDP
-- DLC
-- NST
-- NSDP
-- DLC
-- MCM
-- NST
-- NIC
-- DLC
-- OCoLC
042 ## - AUTHENTICATION CODE
Authentication code pcc
-- nsdp
050 00 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TK7874
Item number .D415
082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.39/5
Edition number 20
210 0# - ABBREVIATED TITLE
Abbreviated title Defect fault toler. VLSI syst.
222 #0 - KEY TITLE
Key title Defect and fault tolerance in VLSI systems
245 00 - TITLE STATEMENT
Title Defect and fault tolerance in VLSI systems.
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc New York :
Name of publisher, distributor, etc Plenum Press,
Date of publication, distribution, etc c1989-c1990.
300 ## - PHYSICAL DESCRIPTION
Extent v. :
Other physical details ill. ;
Dimensions 26 cm.
310 ## - CURRENT PUBLICATION FREQUENCY
Current publication frequency Annual
362 0# - DATES OF PUBLICATION AND/OR SEQUENTIAL DESIGNATION
Dates of publication and/or sequential designation Vol. 1-v. 2.
500 ## - GENERAL NOTE
General note Proceedings of the 1988-1989 International Workshop on Defect and Fault Tolerance in VLSI Systems.
590 ## - LOCAL NOTE (RLIN)
Local note SERBIB/SERLOC merged record
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Integrated circuits
General subdivision Very large scale integration
-- Design and construction
Form subdivision Congresses.
9 (RLIN) 3220
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Integrated circuits
General subdivision Fault tolerance
Form subdivision Congresses.
9 (RLIN) 3221
711 2# - ADDED ENTRY--MEETING NAME
Meeting name or jurisdiction name as entry element International Workshop on Defect and Fault Tolerance in VLSI Systems.
9 (RLIN) 3222
785 00 - SUCCEEDING ENTRY
Main entry heading International Workshop on Defect and Fault Tolerance in VLSI Systems
Title Proceedings
International Standard Serial Number 1063-6722
Record control number (DLC) 92656204
-- (OCoLC)26111494
906 ## - LOCAL DATA ELEMENT F, LDF (RLIN)
a 7
b cbc
c serials
d 2
e ncip
f 19
g n-oclcserc
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Library of Congress Classification
Item type Books
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Home library Current library Shelving location Date acquired Source of acquisition Total Checkouts Full call number Barcode Date last seen Price effective from Koha item type
    Library of Congress Classification     Informatics and Virtual Education Library Collection Informatics and Virtual Education Library Collection General Collection 08/06/2015 Donation   TK7874 .D415 1990 2708 08/06/2015 08/06/2015 Books
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