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Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films, Washington, D.C., 1963. (Meeting Name)

Number of records used in: 1

Preferred form: Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films, Washington, D.C., 1963.

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Work cat.: (OSt)0: E. Passaglia,r . 26407, Ellipsometry in the measurement of surfaces and thin films;, 1964.