Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.
By: Abramovici, Miron
.
Contributor(s): Breuer, Melvin A | Friedman, Arthur D.
Material type: 
TextSeries: Electrical engineering communications and signal processing series: Publisher: New York, NY : Computer Science Press, c1990Description: xxi, 653 p. : ill. ; 25 cm.ISBN: 0716781794 :.Subject(s): Digital integrated circuits -- Testing | Digital integrated circuits -- Design and constructionDDC classification: 621.381/5
| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
Books
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Library Collection of Informatics and Virtual Education General Collection | TK7874 .A23 1990 (Browse shelf) | Available | 1464 |
Includes bibliographical references (p. 644-645) and index.
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