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Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.

By: Abramovici, Miron.
Contributor(s): Breuer, Melvin A | Friedman, Arthur D.
Material type: TextTextSeries: Electrical engineering communications and signal processing series: Publisher: New York, NY : Computer Science Press, c1990Description: xxi, 653 p. : ill. ; 25 cm.ISBN: 0716781794 :.Subject(s): Digital integrated circuits -- Testing | Digital integrated circuits -- Design and constructionDDC classification: 621.381/5
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Item type Current location Call number Status Date due Barcode
Books Books Library Collection of Informatics and Virtual Education
General Collection
TK7874 .A23 1990 (Browse shelf) Available 1464

Includes bibliographical references (p. 644-645) and index.

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