Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.
Material type:
TextSeries: Electrical engineering communications and signal processing seriesPublication details: New York, NY : Computer Science Press, c1990.Description: xxi, 653 p. : ill. ; 25 cmISBN: - 0716781794 :
- 621.381/5 20
- TK7874 .A23 1990
| Item type | Current library | Call number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|
Books
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Informatics and Virtual Education Library Collection General Collection | TK7874 .A23 1990 (Browse shelf(Opens below)) | Available | 1464 |
Browsing Informatics and Virtual Education Library Collection shelves, Shelving location: General Collection Close shelf browser (Hides shelf browser)
| TK7872.F73 G59 1996 Digital techniques in frequency synthesis / | TK7872.O7 H5 1987 High-power microwave sources / | TK7872.T6 M53 1985 Micromachining and micropackaging of transducers / | TK7874 .A23 1990 Digital systems testing and testable design / | TK7874 .A75 1989 Chip-level modeling with VHDL / | TK7874 .B345 1990 Circuits, interconnections, and packaging for VLSI / | TK7874 .B376 1991 Minnie and Hspice for analogue circuit simulation. |
Includes bibliographical references (p. 644-645) and index.
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