VLSI reliability / Anant G. Sabnis.
Material type:
TextPublication details: San Diego: Academic Press, 1990Description: xiii, 207 p. : ill. ; 24 cmISBN: - 0122341228
- TK7874 .S23 1990
| Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|
Books
|
Informatics and Virtual Education Library Collection General Collection | Non-fiction | TK7874 .S23 1990 (Browse shelf(Opens below)) | C.1 | Available | 2717 |
Browsing Informatics and Virtual Education Library Collection shelves, Shelving location: General Collection, Collection: Non-fiction Close shelf browser (Hides shelf browser)
| No cover image available | No cover image available | |||||||
| TK7874 .M85 1997 Multi-chip module test strategies / | TK7874 .N53 1991 Microprocessor Interface Design: digital circuits and concepts/ | TK7874.R36 1993 VLSI algorithms and architectures: advanced concepts / | TK7874 .S23 1990 VLSI reliability / | TK 7874 .W65 1990 Silicon processing for the VLSI: Process integration / | TK 7874 .W65 1995 Silicon processing for the VLSI era / | TK 7874 .W65 1995 Silicon processing for the VLSI era / |
Includes bibliographical references and index.
There are no comments on this title.
Log in to your account to post a comment.