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Multi-chip module test strategies / Edited by Yervant Zorian.

Contributor(s): Material type: TextTextSeries: Frontiers in electronic testingPublication details: Boston: Kluwer Academic Publishers, 1997Description: 166 p. : ill. ; 27 cmISBN:
  • 079239920X
Subject(s): LOC classification:
  • TK7874 .M85 1997
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Holdings
Item type Current library Collection Call number Copy number Status Date due Barcode
Books Books Informatics and Virtual Education Library Collection General Collection Non-fiction TK7874 .M85 1997 (Browse shelf(Opens below)) C.1 Available 2731

Includes bibliographical references and index.

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