Image from Google Jackets

Integrated circuit quality and reliability / Eugene R. Hnatek.

By: Material type: TextTextSeries: Electrical engineering and electronics ; 91Publication details: New York : M. Dekker, c1995.Edition: 2nd ed., rev. and expandedDescription: xiii, 786 p. : ill. ; 24 cmISBN:
  • 0824792831 (acidfree paper)
Subject(s): DDC classification:
  • 621.3815 20
LOC classification:
  • TK7874 .H535 1995
Online resources:
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Call number Status Date due Barcode
Books Books Informatics and Virtual Education Library Collection General Collection TK7874 .H535 1995 (Browse shelf(Opens below)) Available 2739

Includes bibliographical references and index.

There are no comments on this title.

to post a comment.
© The University of Dodoma 2020