TY  - BOOK
ED  - Institute of Electrical and Electronics Engineers.
TI  - ATFA-78: advanced techniques in failure analysis 
AV  - TK7870 .A284 1978
U1  - 621.381/028 
PY  - 1978///
CY  - New York
PB  - IEEE
KW  - Electronic apparatus and appliances
KW  - Testing
KW  - Congresses
KW  - Semiconductors
N1  - Includes bibliographical references and index
ER  -