TY  - BOOK
AU  - Abramovici,Miron
AU  - Breuer,Melvin A.
AU  - Friedman,Arthur D.
TI  - Digital systems testing and testable design
T2  - Electrical engineering, communications, and signal processing
SN  - 0716781794 :
AV  - TK7874 .A23 1990
U1  - 621.381/5 20
PY  - 1990///
CY  - New York, NY
PB  - Computer Science Press
KW  - Digital integrated circuits
KW  - Testing
KW  - Design and construction
N1  - Includes bibliographical references (p. 644-645) and index
ER  -