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1.
Logic testing and design for testability / Hideo Fujiwara. by Series: MIT Press series in computer systems
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Cambridge, Mass. : MIT Press, c1985
Availability: Items available for loan: Informatics and Virtual Education Library Collection (1)Call number: TK7868.L6 F85 1985.

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2.
Design of testable logic circuits / R.G. Bennetts. by Series: Microelectronics systems design series
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: London ; Reading, Mass. : Addison-Wesley Pub. Co., c1984
Availability: Items available for loan: Informatics and Virtual Education Library Collection (1)Call number: TK7868.L6 B45 1984.

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3.
Structured logic testing / Edward B. Eichelberger ... [et al.]. by Series: Prentice Hall series in computer engineering
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Englewood Cliffs, N.J. : Prentice Hall, c1991
Availability: Items available for loan: Informatics and Virtual Education Library Collection (1)Call number: TK7868.L6 S78 1991.

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