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Tutorial test generation for VLSI chips / [edited by] Vishwani D. Agrawal and Sharad C. Seth.

Contributor(s): Material type: TextTextPublication details: Washington, D.C. : Computer Society Press ; Los Angeles, CA : Order from Computer Society, c1988.Description: x, 401 p. : ill. ; 29 cmISBN:
  • 081868786X
  • 0818647868 (microfiche)
Subject(s): DDC classification:
  • 621.39/5/0287 20
LOC classification:
  • TK7874 .T8857 1988
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Holdings
Item type Current library Call number Status Date due Barcode
Books Books Informatics and Virtual Education Library Collection General Collection TK7874 .T8857 1988 (Browse shelf(Opens below)) Available 165413

"Computer Society order number 786."

"IEEE catalog number EH0278-2."

Includes index.

Bibliography: p. 333-394.

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