Tutorial test generation for VLSI chips / [edited by] Vishwani D. Agrawal and Sharad C. Seth.
Material type: TextPublication details: Washington, D.C. : Computer Society Press ; Los Angeles, CA : Order from Computer Society, c1988.Description: x, 401 p. : ill. ; 29 cmISBN:- 081868786X
- 0818647868 (microfiche)
- 621.39/5/0287 20
- TK7874 .T8857 1988
Item type | Current library | Call number | Status | Date due | Barcode | |
---|---|---|---|---|---|---|
Books | Informatics and Virtual Education Library Collection General Collection | TK7874 .T8857 1988 (Browse shelf(Opens below)) | Available | 165413 |
"Computer Society order number 786."
"IEEE catalog number EH0278-2."
Includes index.
Bibliography: p. 333-394.
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