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	1.	E-learning by design / William Horton. by Horton, William K. (William Kendall) Material type: Text; Format: print ; Literary form: Not fiction Publication details: San Francisco : Pfeiffer, 2006 Online access: Table of contents only Publisher description Contributor biographical information Availability: Items available for loan: Informatics and Virtual Education Library Collection (4)Call number: HF 5549.5 .T7H63 2006, ... Place hold Add to cart (remove)
	2.	No cover image available Materials reliability in microelectronics : symposium held ... Series: Materials Research Society symposia proceedings Material type: Continuing resource; Format: print Publication details: Pittsburgh, Pa. : Materials Research Society, c1992- Availability: Items available for loan: Informatics and Virtual Education Library Collection (1)Call number: TK7874 .M344251991. Place hold Add to cart (remove)
	3.	Reliability, yield, and stress burn-in : a unified approach for microelectronics systems manufacturing & software development / by Way Kuo, Wei-Ting Kary Chien, Taeho Kim. by Kuo, Way, 1951- Chien, Wei-Ting Kary, 1965- Kim, Taeho, 1960- Material type: Text; Format: print ; Literary form: Not fiction Publication details: Boston, Mass : Kluwer Academic Publishers, c1998 Online access: Publisher description Table of contents only Availability: Items available for loan: Informatics and Virtual Education Library Collection (1)Call number: TK7874 .K867 1998. Place hold Add to cart (remove)

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