Multi-chip module test strategies / edited by Yervant Zorian.

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Material type: Text

TextSeries: Frontiers in electronic testingPublication details: Boston : Kluwer, c1997.Description: 166 p. : ill. ; 27 cmISBN:

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Item type	Current library	Call number	Status	Date due	Barcode
Books	Informatics and Virtual Education Library Collection General Collection	TK7874 .M862 1997 (Browse shelf(Opens below))	Available		2731

"Reprinted from a special issue of Journal of electronic testing: theory and applications, vol. 10, nos. 1 & 2, April 1997."

Includes bibliographical references and index.

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