Logic testing and design for testability / Hideo Fujiwara.

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Material type: Text

TextSeries: MIT Press series in computer systemsPublication details: Cambridge, Mass. : MIT Press, c1985.Description: x, 284 p. : ill. ; 24 cmISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	Informatics and Virtual Education Library Collection General Collection	TK7868.L6 F85 1985 (Browse shelf(Opens below))	Available		3691

Includes index.

Bibliography: p. [272]-278.

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