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1.
Integrated circuit quality and reliability / Eugene R. Hnatek. by Series: Electrical engineering and electronics ; 91
Edition: 2nd ed., rev. and expanded.
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: New York : M. Dekker, c1995
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Availability: Items available for loan: Informatics and Virtual Education Library Collection (1)Call number: TK7874 .H535 1995.

2.
VLSI RISC architecture and organization / Stephen B. Furber. by Series: Electrical engineering and electronics ; 56
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: New York : M. Dekker, [1989]
Availability: Items available for loan: Informatics and Virtual Education Library Collection (1)Call number: QA76.5 .F865 1989.

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