000			01358cam a2200313 4500
001			773230
005			20171002090331.0
008			710714s1971 paua b 100 0 eng
010			_a 72137455
020			_a0803100701
040			_aDLC _cDLC _dDLC
050	0	0	_aQC 481 _b.S93 1970
082	0	0	_a537.5/352
100			_aRUSS, J.C _963377
111	2		_aSymposium on Energy Dispersion X-ray Analysis: X-ray and Electron Probe Analysis, _cToronto, _d1970. _921825
245	1	0	_aEnergy dispersion X-ray analysis: _b X-ray and electron probe analysis / _cJ. C. Russ, coordinator
260			_aPhiladelphia: _bAmerican Society for Testing and Materials, _c[1971]
300			_a285 p. : _bill. ; _c24 cm.
350			_a$20.00
490	1		_aASTM special technical publication _v485
500			_a"A symposium presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970."
500			_aSponsored by the ASTM Committee E-4 on Metallography.
504			_aIncludes bibliographical references.
650		0	_aX-ray spectroscopy _xCongresses. _921826
710	2		_aAmerican Society for Testing and Materials. _bCommittee E-4 on Metallography. _921827
830		0	_aASTM special technical publication ; _v485. _97511
906			_a7 _bcbc _corignew _d2 _encip _f19 _gy-gencatlg
942			_2lcc _cBK
999			_c10319 _d10319