| 000 | 00875cam a2200253 i 4500 | ||
|---|---|---|---|
| 001 | 4599621 | ||
| 005 | 20171002112341.0 | ||
| 008 | 761203s1977 gw a b 001 0 eng | ||
| 010 | _a 76051772 | ||
| 020 | _a0387080783 | ||
| 040 |
_aDLC _cDLC _dDLC |
||
| 050 | 0 | 0 |
_aQC 454 _b.E4E45 1977 |
| 082 | 0 | 0 | _a539.7/2112 |
| 245 | 0 | 0 |
_aElectron spectroscopy for surface analysis / _cedited by H. Ibach ; with contributions by J. D. Carette ... [et al.]. |
| 260 |
_aBerlin: _bSpringer-Verlag, _c1977 |
||
| 300 |
_ax, 255 p. : _bill. ; _c25 cm. |
||
| 440 | 0 |
_aTopics in current physics ; _vv. 4 _922137 |
|
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 |
_aElectron spectroscopy. _922138 |
|
| 650 | 0 |
_aSurfaces (Technology) _xAnalysis. _922139 |
|
| 700 | 1 |
_aIbach, H., _d1941- _920871 |
|
| 906 |
_a7 _bcbc _corignew _d1 _eocip _f19 _gy-gencatlg |
||
| 942 |
_2lcc _cBK |
||
| 999 |
_c10406 _d10406 |
||