000 00565nam a22001697a 4500
008 150817b xxu||||| |||| 00| 0 eng d
020 _a0201737256
050 _aQA 76.6
_bB87 2001
100 _aBuwalda, Hans
_932142
245 _aIntegrated test design and automation :
_busing the test frame method /
_cHans, Buwalda. Dennis, Janssen. Iris pinster
260 _aBoston:
_bAddison- Wesley,
_c2001
300 _axi, 242p. :
_bill. ;
_c23cm
521 _aincludes index
650 _aAutomation
_970178
650 _aIntergrated test design
_970179
942 _2lcc
_cBK
999 _c14054
_d14054