000 00763pam a2200193 a 4500
999 _c21879
_d21879
008 870105s1987 nyua b 001 0 eng
020 _a0471857742
050 0 0 _aTS156
_b.M45 1987
100 1 _aMessina, William S.
_948772
245 1 0 _aStatistical quality control for manufacturing managers /
_cWilliam S. Messina.
260 _aNew York :
_bJohn Wiley & Sons,
_c1987
300 _axiii, 331 p.:
_bill.,
_c24 cm.
521 _aincludes index
650 0 _aQuality control
_xStatistical methods.
_948774
856 4 _3Table of Contents
_uhttp://www.loc.gov/catdir/toc/onix01/86034022.html
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/enhancements/fy0706/86034022-d.html
906 _a7
_bcbc
_corignew
_d1
_eocip
_f19
_gy-gencatlg
942 _2lcc
_cBK