| 000 | 00924nam a2200241 i 4500 | ||
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| 001 | 4159022 | ||
| 005 | 20240902122628.0 | ||
| 008 | 790119s1977 nyua b 101 0 eng | ||
| 010 | _a 78111833 | ||
| 040 |
_aDLC _cDLC _dDLC |
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| 050 | 0 | 0 |
_aTK7870 _b.A284 1978 |
| 082 | 0 | 0 | _a621.381/028 |
| 245 | 0 | 0 |
_aATFA-78 : _badvanced techniques in failure analysis / _c Institute of Electrical and Electronics Engineers, inc. ...[ et al.]. |
| 260 |
_aNew York: _bIEEE, _c1978 |
||
| 300 |
_aviii,199 p. : _bill. ; _c28 cm. |
||
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 |
_aElectronic apparatus and appliances _xTesting _xCongresses. _9103221 |
|
| 650 | 0 |
_aSemiconductors _xTesting _xCongresses. _9103222 |
|
| 710 | 2 |
_aInstitute of Electrical and Electronics Engineers. _9103223 |
|
| 740 | _aAdvanced techniques in failure analysis. | ||
| 906 |
_a7 _bcbc _corignew _d2 _encip _f19 _gy-gencatlg |
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| 942 |
_2lcc _cBK |
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_c37669 _d37669 |
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