Normal view MARC view ISBD view

Quantification of type C cracks in polycrystalline photovoltaic modules from electroluminescence images using thresholding approach for power loss estimation and maintainance.

SWILLA, Ibrahim Cletus.

Quantification of type C cracks in polycrystalline photovoltaic modules from electroluminescence images using thresholding approach for power loss estimation and maintainance. /Ibrahim Cletus Swilla. - DODOMA: The University of Dodoma. 2025. - xiii, 89p.; ill.; 27cm.

LC Class. No.: TK1087 / .S95 2025

Print
Cite
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)