Quantification of type C cracks in polycrystalline photovoltaic modules from electroluminescence images using thresholding approach for power loss estimation and maintainance. /Ibrahim Cletus Swilla.
Material type:
TextPublication details: DODOMA: The University of Dodoma. 2025.Description: xiii, 89p.; ill.; 27cmLOC classification: - TK1087 .S95 2025
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Natural and Mathematical Sciences Library Collection Special Reserve | Non-fiction | TK1087 .S95 2025 (Browse shelf(Opens below)) | C.1 | Not For Loan | 181644 |
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