Ellipsometry in the measurement of surfaces and thin films : symposium proceedings / Passaglia , E R
Material type: TextPublication details: Washington: U.S. National Bureau of Standards, 1964Description: vi, 359 p. : ill. ; 24 cmSubject(s): DDC classification:- 535.5
- QC 100 .U57 1963
Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode | |
---|---|---|---|---|---|---|---|---|
Books | Education Library Collection General Collection | Non-fiction | QC 100 .U57 1963 (Browse shelf(Opens below)) | 1-1 | Available | 13713 |
Edited by E. Passaglia, R.R. Strombery, and J. Kruger.
Includes bibliographies.
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