Ellipsometry in the measurement of surfaces and thin films : symposium proceedings / Passaglia , E R

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Material type: Text

TextPublication details: Washington: U.S. National Bureau of Standards, 1964Description: vi, 359 p. : ill. ; 24 cmSubject(s):

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Holdings
Item type	Current library	Collection	Call number	Copy number	Status	Date due	Barcode
Books	Education Library Collection General Collection	Non-fiction	QC 100 .U57 1963 (Browse shelf(Opens below))	1-1	Available		13713

Edited by E. Passaglia, R.R. Strombery, and J. Kruger.

Includes bibliographies.

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