A unified approach for timing verification and delay fault testing / Mukund Sivaraman and Andrzej J. Strojwas.
By: Sivaraman, Mukund
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Contributor(s): Strojwas, Andrzej J.
Material type: 
TextPublisher: Boston : Kluwer Academic, c1998Description: xv, 155 p. : ill. ; 25 cm.ISBN: 0792380797 (alk. paper).Subject(s): Digital integrated circuits -- Design and construction -- Data processing | Digital integrated circuits -- Testing | Delay faults (Semiconductors) | Integrated circuits -- VerificationDDC classification: 621.39/5/0287 Online resources: Publisher description | Table of contents only
| Item type | Current location | Call number | Status | Date due | Barcode |
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Books
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Library, College of Informatics and Virtual Education (CIVE) General Collection | TK7874.65 .S58 1998 (Browse shelf) | Available | 1963 |
Includes bibliographical references (p. [139]-152) and index.
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