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A unified approach for timing verification and delay fault testing / Mukund Sivaraman and Andrzej J. Strojwas.

By: Sivaraman, Mukund, 1970-.
Contributor(s): Strojwas, Andrzej J.
Material type: TextTextPublisher: Boston : Kluwer Academic, c1998Description: xv, 155 p. : ill. ; 25 cm.ISBN: 0792380797 (alk. paper).Subject(s): Digital integrated circuits -- Design and construction -- Data processing | Digital integrated circuits -- Testing | Delay faults (Semiconductors) | Integrated circuits -- VerificationDDC classification: 621.39/5/0287 Online resources: Publisher description | Table of contents only
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Item type Current location Call number Status Date due Barcode
Books Books Library, College of Informatics and Virtual Education (CIVE)
General Collection
TK7874.65 .S58 1998 (Browse shelf) Available 1963

Includes bibliographical references (p. [139]-152) and index.

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